Abstract: In th is paper we attempt to derive an equation from the Beta-binomial distribution that can be used to apply sequential probability ratio testing to biometric devices. WE first examine sequential analysis testing methods and thena pply them to t examples of multiple independent bernoulli trials. We use these exmples to ilustrate the decision of when to stop testing. Lastly, we examine the Beta-binomial distribution and derive an equation that can be u sed in sequential analysis methodology.