Selected Papers in collaboration with Hans Hallen at NC State University

Near-Field Raman Spectroscopy:

Eric Ayars and H.D. Hallen, "Surface enhancement in near-field Raman spectroscopy," Appl. Phys. Lett. 76 (26) 3911-13 (2000).

C.L. Jahncke, H.D. Hallen, and M. A. Paesler, "Nano-Raman spectroscopy and imaging with the near-field scanning optical microscope," J. Raman Spectroscopy, 27, 579-586 (1996) -- An invited paper.

C.L. Jahncke, M. A. Paesler, and H.D. Hallen, "Raman imaging with near-field scanning optical microscopy," Appl. Phys. Lett. 67, (17), 2483-2485 (1995).

H. D. Hallen, A. La Rosa, and C.L. Jahncke, "Near-field scanning optical microscopy and spectroscopy for semiconductor characterization," Physica Status Solidi (a) 152, 257-268 (1995).

H. D. Hallen, M. A. Paesler and C. L. Jahncke, "Raman Spectroscopy: Probing the Border Between Near-Field and Far-Field Spectroscopy," SPIE Proceedings 3467 (1998).

C.L. Jahncke and H. D. Hallen."Near-field Raman Spectra: surface enhancement, z-polarization, fiber Raman background, and Rayleigh scattering", 9th annual meeting of IEEE Lasers and Electro-Optics Society (LEOS) 96 conference proceedings volume 1, pp. 176-177.

Gradient-Field Raman:

Eric Ayars, H. D. Hallen and C. L. Jahncke, "Electric field gradient effects in Raman spectroscopy," (in press, PRL).

E.J. Ayars, C.L. Jahncke, M.A. Paesler, and H.D. Hallen, " Fundamental differences between micro- and nano-Raman spectroscopy," The 6th International Conference on Near Field Optics and Related Techniques, August 27..31, 2000, University of Twente, The Netherlands.

E. J. Ayars, M. A. Paesler and H. D. Hallen, "Near-field Raman spectroscopy: electric field gradient effects," Proceedings of IUMAS 2000, The 2000 Meeting of the International Union of Microbeam Analysis Societies, Kailua-Kona, Hawaii, July 9th-13th 2000, Inst. Phys. Conf. Ser. No. 165: Symposium 1, p. 115.

Nano-Scale Mapping of Carrier Lifetime:

La Rosa, C.L. Jahncke, and H.D. Hallen, "Time-resolved contrast in near-field scanning optical microscopy of semiconductors," SPIE Proceedings 2384, 101-108 (1995).

La Rosa, C.L. Jahncke, and H.D. Hallen, "Time as a contrast mechanism in near-field imaging," Ultramicroscopy 57, 303-308 (1995).

Near-Field Scanning Optical Microscopy Technique Related:

C.L. Jahncke and H.D. Hallen, "A versatile, stable scanning proximal probe microscope," Review of Scientific Instruments, 68 (4), 1759 (1997).

M.A. Paesler, H.D. Hallen, B.I. Yakobson, C.J. Jahncke, P.O. Boykin, and A. Meixner, "Near-field optical spectroscopy: enhancing the light budget," Microscopy and Microanalysis 3, 815 (1997).

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